JPH0511574B2 - - Google Patents

Info

Publication number
JPH0511574B2
JPH0511574B2 JP60018152A JP1815285A JPH0511574B2 JP H0511574 B2 JPH0511574 B2 JP H0511574B2 JP 60018152 A JP60018152 A JP 60018152A JP 1815285 A JP1815285 A JP 1815285A JP H0511574 B2 JPH0511574 B2 JP H0511574B2
Authority
JP
Japan
Prior art keywords
transparent
electrical signal
plate
signal
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60018152A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61176839A (ja
Inventor
Masami Okino
Yasuhiro Osada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanebo Ltd
Original Assignee
Kanebo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanebo Ltd filed Critical Kanebo Ltd
Priority to JP1815285A priority Critical patent/JPS61176839A/ja
Publication of JPS61176839A publication Critical patent/JPS61176839A/ja
Publication of JPH0511574B2 publication Critical patent/JPH0511574B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1815285A 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置 Granted JPS61176839A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1815285A JPS61176839A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1815285A JPS61176839A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置

Publications (2)

Publication Number Publication Date
JPS61176839A JPS61176839A (ja) 1986-08-08
JPH0511574B2 true JPH0511574B2 (en]) 1993-02-15

Family

ID=11963639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1815285A Granted JPS61176839A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置

Country Status (1)

Country Link
JP (1) JPS61176839A (en])

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0750038B2 (ja) * 1990-10-04 1995-05-31 三井東圧化学株式会社 プラスチックフィルムのシースルー特性の測定方法
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3411829B2 (ja) * 1997-07-02 2003-06-03 旭硝子株式会社 表面形状の評価方法および評価装置
DE19813073A1 (de) * 1998-03-25 1999-09-30 Laser Sorter Gmbh Verfahren und Vorrichtung zur Bestimmung der optischen Qualität und zur Detektion von Fehlern von Flachglas und anderen optisch transparenten Materialien, insbesondere von Drips, Fäden und Linien
JP4633245B2 (ja) * 2000-11-06 2011-02-16 住友化学株式会社 表面検査装置及び表面検査方法
FR2958404B1 (fr) * 2010-04-01 2012-04-27 Saint Gobain Procede et dispositif d'analyse de la qualite optique d'un substrat transparent

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102653A (en]) * 1972-04-10 1973-12-24
JPS59147006U (ja) * 1983-03-22 1984-10-01 サンクス株式会社 不良品検出装置

Also Published As

Publication number Publication date
JPS61176839A (ja) 1986-08-08

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